Dependence of irradiated high-power electromagnetic waves on the failure threshold time of semicondu

Min, S.-H., Kim, J.-I., Sattorov, M., Kim, S., Hong, D., Kim, S., Hong, B.-H., Park, C., Ma, S., Kim, M., Lee, K.-C., Lee, Y.-J., Kwon, H.-B., Yoo, Y.-J., Park, S.-Y., Park, G.-S.
Electronics , 10(16), 1884(2021)
DOI: 10.3390/electronics10161884